Three-dimensional shape measurement with dual reference phase maps

Three-dimensional shape measurement with dual reference phase maps

Single reference-phase-based methods have been extensively utilized in digital fringe projection systems, yet they might not provide the maximum sensitivity given a hardware system configuration. This paper presents an innovative method to improve the measurement quality by utilizing two orthogonal phase maps. Specifically, two reference phase maps generated from horizontal and vertical (i.e., ...

Three-dimensional absolute shape measurement by combining binary statistical pattern matching with phase-shifting methods.

This paper presents a novel method that leverages the stereo geometric relationship between projector and camera for absolute phase unwrapping on a standard one-projector and one-camera structured light system. Specifically, we use only one additional binary random image and the epipolar geometric constraint to generate a coarse correspondence map between projector and camera images. The coarse...

Phase error compensation for three-dimensional shape measurement with projector defocusing.

This paper analyzes the phase error for a three-dimensional (3D) shape measurement system that utilizes our recently proposed projector defocusing technique. This technique generates seemingly sinusoidal structured patterns by defocusing binary structured patterns and then uses these patterns to perform 3D shape measurement by fringe analysis. However, significant errors may still exist if an o...

Uniaxial three-dimensional shape measurement with projector defocusing

Three-dimensional shape measurement with a fast and accurate approach.

A noncontact, fast, accurate, low-cost, broad-range, full-field, easy-to-implement three-dimensional (3D) shape measurement technique is presented. The technique is based on a generalized fringe projection profilometry setup that allows each system component to be arbitrarily positioned. It employs random phase-shifting, multifrequency projection fringes, ultrafast direct phase unwrapping, and ...